Thin Film Deposition Controllers/QCM Measurement Instruments
INFICON market-leading thin film deposition controllers, monitors and QCM measurement instruments control deposition rate and thickness of the most complex processes with unsurpassed measurement speed and precision. Enhanced software and logic I/O features allow the our thin film deposition controllers/QCM measurement instruments to be fully integrated into the vacuum system for automatic process control. To control less complex processes, use INFICON economical, precision controllers, monitors and QCM measurement instruments that measure films with 100 times more precision than conventional techniques.
Most INFICON crystal-based instruments use our patented measurement system, ModeLock, making them the most advanced instruments available.
More information about our thin film deposition/QCM instruments.
